Arm’s interconnect technology on GF’s 12LP process enables high performance and low latency, while increasing bandwidth for high core designs in AI, Cloud Computing and Mobile SoCs.
GLOBALFOUNDRIES, the world’s leading specialty foundry, today announced that it has taped-out an Arm-based 3D high-density test chip that will enable a new level of system performance and power efficiency for computing applications such as AI/ML and high-end consumer mobile and wireless solutions. The new chip was fabricated using GF’s 12nm Leading-Performance (12LP) FinFET process and features Arm’s mesh interconnect technology in 3D that allows data to take a more direct path to other cores, minimizing latency while increasing data transfer rates as demanded by data centers, edge computing and high-end consumer applications.
The delivery of this chip demonstrates the fast progress that Arm and GF are making in researching and developing differentiated solutions that enable improvements in device density and performance for scalable high-performance computing. Moreover, the companies validated a 3D Design-for-Test (DFT) methodology, using GF’s hybrid wafer-to-wafer bonding that can enable up to 1 million 3D connections per mm2, extending the ability to scale 12nm designs long into the future.